The effect of the recombination mechanisms location on the temperature sensitivity of thin-film photovoltaic cells

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dc.contributor.authorN'detigma, Kata
dc.contributor.authorDiouf, Djicknoum
dc.contributor.authorDarga, Arouna
dc.contributor.authorAmadou, Seidou Maiga
dc.date.accessioned2022-05-17T10:30:08Z
dc.date.available2022-05-17T10:30:08Z
dc.date.issued2019-01
dc.descriptionThe weighted average cost of installed solar photovoltaicelectricity dropped from $5 /Watt in 2009 to about $2 /Watt in 2015 [1].en_US
dc.description.abstractThin film solar cells temperature sensitivity and impact of the main recombination mechanism location are investigated in this paper. The main mechanisms in bulk and at the heterojunction interface are discriminated. Using a 1D simulation software, “Solar Cell Capacitance Simulator” (SCAPS), we observed a higher temperature coefficient of open circuit voltage (Voc) for cells with main recombination centers at the interface than the one with main recombination centers in volume. Furthermore, an LTSpice module model is used to visualize the effects of the recombination centers’ location on the performance ratios of the modules. The results show more degradation for the ratios performance of cells with the main recombination mechanisms at the interface than those in volume.en_US
dc.description.sponsorshipWorld Banken_US
dc.identifier.citationN. Kata, D. Diouf, A. Darga, A. Seidou Maiga, The effect of the recombination mechanisms location on the temperature sensitivity of thin-film photovoltaic cells, EPJ Photovoltaics 10, 8 (2019)en_US
dc.identifier.urihttp://hdl.handle.net/123456789/1441
dc.language.isoenen_US
dc.publisherEDP Sciences / Research gateen_US
dc.relation.ispartofserieshttps://doi.org/10.1051/epjpv/2019008;7
dc.subjectTemperature sensitivityen_US
dc.subjectrecombination mechanismsen_US
dc.subjectratios performanceen_US
dc.subjectthin film cellsen_US
dc.titleThe effect of the recombination mechanisms location on the temperature sensitivity of thin-film photovoltaic cellsen_US
dc.typeArticleen_US
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